A63.7062 Tungsten Filament Scanning Electron Microscope Eco. SEM

Specifications :

Resolution 4.5nm@30KV(SE); 6nm@30KV(BSE)
Magnification Negative Magnification: 15x~250000x; Screen Magnification: 30x~500000x
Electron Gun Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
Accelerating Voltage 0~30KV
Lens System Three-level Electromagnetic Lens (Tapered Lens)
Objective Aperture Molybdenum Aperture Adjustable Outside Vacuum System
Specimen Stage Five Axes Stage
Travel Range X(Auto) 0~50mm
Y(Auto) 0~50mm
Z(Manual) 0~25mm
R(Manual) 360ยบ
T(Manual) -5ยบ~90ยบ
Max Specimen Diameter 150mm
Detector SE: High Vacuum Secondary Electron Detector (With Detector Protection)
Modification Stage Upgrade;EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser
Accessories CCD,LaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine
Vacuum System Turbo Molecular Pumps;Rotation Pump
Electron Beam Current 10pA~0.1ฮผA
PC Customized Dell Work Station
Model No A63.7062
Standard Magnification 5x-250000x
Head Inclination 90ยฐ
Head Interpupillary 54-75mm
Head Specifications 4.5nm@1KV(SE)

6nm@30KV(BSE)

Objective Detector SE
Working Stage Spec. Five Axes Stage(Auto X/Y, Manual Z/R/T), Max Specimen Dia. 150mm
Transmit Light Tungsten Filament Catridge, Voltage 0-30KV
Other Specification Turbo Molecular Pump, Mechanical Pump

Reviews

There are no reviews yet.

Be the first to review “A63.7062 Tungsten Filament Scanning Electron Microscope Eco. SEM”

Your email address will not be published. Required fields are marked *

Scroll to Top