A63.7081 Schottky Field Emission Gun Scanning Electron Microscope Pro FEG SEM

Specifications :

Resolution 1nm@30KV(SE); 3nm@1KV(SE); 2.5nm@30KV(BSE)
Magnification 15x~800000x
Electron Gun Schottky Emission Electron Gun
Electron Beam Current 10pA~0.3μA
Accelerating Voatage 0~30KV
Vacuum System 2 Ion Pumps, Turbo Molecular Pump, Mechanical Pump
Detector SE: High Vacuum Secondary Electron Detector (With Detector Protection)
BSE: Semiconductor Four Segmentation Back Scattering Detector
CCD
Specimen Stage Five Axes Eucentric Motorized Stage
Travel Range X 0~150mm
Y 0~150mm
Z 0~60mm
R 360º
T -5º~75º
Max Specimen Diameter 320mm
Modification EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser Etc.
Accessories X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine Etc.
Model No A63.7081
Standard Magnification 15x-500000x
Head Inclination 90º
Head Interpupillary 54-75mm
Head Specifications 1nm@30KV(SE)

3nm@1KV(SE)

2.5nm@30KV(BSE)

Objective Detector SE, BSE, CCD
Working Stage Spec. Five Axes Eucentric Motorized Stage. Large Size, Max Specimen Dia. 320mm
Transmit Light Schottky Field Emission Gun, Beam Current 10pA-0.3μA, Voltage 0-30KV
Other Specification 2 lon Pumps, Turbo Molecular Pump, Mechanical Pump

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